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Durability testing machine Product List

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Provision of evaluation technology for wire probes.

Introduction to Theoretical Analysis of Wire Probe Wear

I worked for six years as a director and executive officer at a manufacturer of wire probes, promoting the research and development of inspection jigs. While operating independently as "Process D&T Lab," I have conducted original research and development on durability issues and plastic deformation of wire probes. Regarding durability, I found that the durability deteriorates more in powered tests than in non-powered tests, and I investigated the cause of this fact. As a result, I believe I have nearly identified the cause of power degradation. From this result, a new design policy for probes has been established. I am considering providing this analysis method. Website: https://www.process-d-and-t-lab.com/ Please refer to "Design & Tools."

  • probe
  • Tester
  • Semiconductor inspection/test equipment
  • Durability testing machine

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